Feature: STN AnaVist, Version 2.0 - Powerful analysis and visualization software, now better than ever!
STN AnaVist, interactive analysis and visualization software, provides unique insights into trends and patterns in scientific and patent information.
The new STN AnaVist, Version 2.0, not only provides many new and enhanced features for analysis and visualization, but also includes content from Derwent World Patents Index (DWPISM).
Current STN customers can download Version 2.0, free of charge, from STN AnaVist Software Licensing.
Introduction
STN AnaVist can help you answer complex questions as well as provide information that can be used to make faster, more informed decisions critical to your business.
With STN AnaVist, you can:
- Analyze the patent landscape - determine who, what, where, when, and why
- Track competitive intelligence - find out what your competitors are doing
- Discover new applications for exisiting technology
- Determine research trends - find whether a particular area of reseach is on the rise, steady, or declining
- Support strategic business planning
Version 2.0 builds on previous versions of STN AnaVist with new and enhanced features, and provides new database content from DWPI. STN AnaVist, Version 2.0, is the only platform that permits simultaneous analysis of CAplus and DWPI, with content processed by STN for optimal visualization.
See what's new in Version 2.0
To explore the new and enhanced features:
- Create a document set for visualization with the precise searching capabilities of STN Express, Version 8.2 or higher.
- Import your document set into STN AnaVist, Version 2.0, and click Visualize...
Import your document set from STN Express, Version 8.2, and click Visualize...
Examine the Research Landscape from your point-of-view - NEW!
In previous versions of STN AnaVist, the Title/Abstract data field was your only choice for clustering. With Version 2.0, you can take advantage of new clustering fields, including Technology Indicators, Exemplary/First Claim, All Claims, and International Patent Classification (IPC) Codes. Customize your visualization using any one of the new clustering fields or any of the text fields in combination.
Select a single data field for clustering, or further customize
your visualization with a combination of text fields.
Gain a more complete understanding of your data - NEW!
With the addition of DWPI, you can create new bar charts based on Derwent Class, Derwent Manual Codes, and Patent Country Codes/Kind Codes.
Create a bar chart with Derwent Class information from DWPI.
Perform comparative analysis with ease - NEW!
In previous versions of STN AnaVist, when you highlighted a portion of a chart or the Research Landscape, corresponding documents in the other charts would highlight automatically. Highlighting in Version 2.0 works as it did in previous versions, but now you can highlight as many as eight different document sets at once - and select from a palette of 40 colors.
Select colors for document highlighting, up to eight colors at once.
Manage your documents - ENHANCED!
Previously, flagging documents was the only way to label documents in STN AnaVist. With Version 2.0, you can apply custom labels to individual documents or document sets and use the Labels bar chart - created automatically and updated every time you apply labels - to sort your documents by label.
Apply custom labels to individual documents or an entire document set at once.
Pinpoint the research of your competitors and customers - NEW!
New 2D display options with white or black backgrounds provide more contrast to show more precisely where your documents lie in the Research Landscape.
Select from three Research Landscape viewing options.
Additional resources
With STN AnaVist, Version 2.0, you can now examine scientific and patent data from all angles. For more information, visit STN AnaVist Products & Services and Support pages.
To learn more about how to use STN AnaVist, Version 2.0, refer to the STNews technical article:
Updated: 7/24/2008 3:24:59 PM
