The following STN Patent Forum will be presented by CAS and FIZ Karlsruhe on June 4, 2008 at the Residence Inn Boston Cambridge in Cambridge, Massachusetts. STN Patent Forums are free, but registration is required.
9:00 am - 10:00 am
What's New on STN?
Get up-to-date on the latest from STN. Learn whats new, including:
- STN Express, Version 8.3
- Prophetic substances in CA/CAplus
- Enhanced timeliness in USGENE
- Custom International Patent Classification (IPC) display formats
- Enhancements for DGENE, INPADOCDB, and WPIX
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10:00 am - 11:15 am
The Virtual Database Reloaded and Remixed
The single best patent database on STN is the one created virtually. To meet your specific needs, use superior multifile capabilities on STN to search, extract, and display portions of records from multiple databases. With several recently reloaded databases, many new opportunities are available to create even better virtual records.
Topics in this session will include:
- Enhanced patent database content, including patent family information, full-text patents, claims, and legal status
- Techniques to easily merge content from several databases
- Eliminating duplicate information across databases
- Setting custom formats that display across multiple databases
- Using STN Express to create custom final merged reports
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11:00 am - 11:15 am
Break
11:15 am - 12:15 pm
The Art of ECLA
Patent searchers need as many tools as possible to perform the most cost-effective, comprehensive, and relevant searches. Addition of the European Classification (ECLA) system to INPADOCDB, CAplus, and RDISCLOSURE allows for more effective cross-file searching. With approximately twice as many classifications as the Advanced International Patent Classification (IPC) system, ECLA also enhances search specificity.
In this session, we will discuss tips and techniques for using ECLA with IPC and In Computer Only (ICO) classification. Whether you are searching for known compounds used with a new delivery method, engineering devices or equipment, oil reforming/refining processes, or semiconductors, this session will help you maximize the comprehensiveness of your retrieval.
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12:15 pm - 1:15 pm
Lunch (provided)
1:15 pm - 2:30 pm
Increasing Your Confidence in STN Patent Search Results
Improve confidence in your patent search results by reviewing STN commands and tools. Tips will include:
- Using appropriate truncation and proximity in bibliographic and full-text patent databases
- Utilizing online thesauri to increase relevant retrieval
- Extending searches effectively across other databases
- Identifying terminology changes across databases
- Extracting terms for duplicate identification and analysis
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2:30 pm - 2:45 pm
Break
2:45 pm - 4:00 pm
Exploring Derwent World Patents Index in STN AnaVist, Version 2.0
STN AnaVist provides you with insight into competitor strategies over time and allows you to scan the big picture view of current research areas. Use STN AnaVist to assimilate and present information more effectively and to assist in management decision making.
In this session, learn how to:
- Discover the latest developments in an area of technology
- Gain immediate insights into the patent activities of competitors and other key players
- Identify key researchers and experts in scientific areas
- Discover collaborative efforts between organizations
The addition of Derwent World Patents Index (DWPI) to STN AnaVist is one of the major enhancements available in Version 2.0. We will use a case-study approach to demonstrate how to:
- Create a DWPI analysis and visualization project
- Customize visualizations with optional data fields, including DWPI Title/Abstract and Exemplary Claim
- Manage documents using your own custom labels
- Use comparison highlighting in charts and the Research Landscape
- Create DWPI-specific charts for DWPI Classes and Manual Codes
This session is designed for both new and experienced users.
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Updated 4/2/2008 1:36:31 PM
